Humidity effects on scanning polarization force microscopy imaging | |
Shen, Yue1,2; Zhou, Yuan1; Sun, Yanxia1,3; Zhang, Lijuan1,3; Wang, Ying2; Hu, Jun2; Zhang, Yi2 | |
刊名 | APPLIED SURFACE SCIENCE |
2017-08-01 | |
卷号 | 412页码:497-504 |
关键词 | Scanning Polarization Force Microscopy Humidity Graphene Oxide Reduced Graphene Oxide Mica |
文献子类 | Article |
英文摘要 | Scanning polarization force microscopy (SPFM) is a useful surface characterization technique to visually characterize and distinguish nanomaterial with different local dielectric properties at nanometer scale. In this paper, taking the individual one-atom-thick graphene oxide (GO) and reduced graphene oxide (rGO) sheets on mica as examples, we described the influences of environmental humidity on SPFM imaging. We found that the apparent heights (AHs) or contrast of SPFM imaging was influenced significantly by relative humidity (RH) at a response time of a few seconds. And this influence rooted in the sensitive dielectric constant of mica surface to the RH change. While dielectric properties of GO and rGO sheets were almost immune to the humidity change. In addition, we gave the method to determine the critical humidity at which the contrast conversion happened under different conditions. And this is important to the contrast control and repeatable imaging of SPFM through RH adjusting. These findings suggest a strategy of controllable and repeatable imaging the local dielectric properties of nanomaterials with SPFM, which is critically important for further distinguishment, manipulation, electronic applications, etc. (C) 2017 Elsevier B.V. All rights reserved. |
WOS关键词 | REDUCED GRAPHENE OXIDE ; WETTING PROPERTIES ; CARBON NANOTUBES ; GRAPHITE OXIDE ; MICA ; WATER ; REDUCTION ; CONDENSATION ; GLYCEROL ; SHEETS |
WOS研究方向 | Chemistry ; Materials Science ; Physics |
语种 | 英语 |
WOS记录号 | WOS:000401392900056 |
内容类型 | 期刊论文 |
源URL | [http://ir.isl.ac.cn/handle/363002/6217] |
专题 | 青海盐湖研究所_青海盐湖研究所知识仓储 青海盐湖研究所_盐湖资源与化学实验室 |
作者单位 | 1.Chinese Acad Sci, Qinghai Inst Salt Lakes, Key Lab Comprehens & Highly Efficient Utilizat Sa, Key Lab Salt Lake Resources Chem Qinghai Prov, Xining 810008, Qinghai, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
推荐引用方式 GB/T 7714 | Shen, Yue,Zhou, Yuan,Sun, Yanxia,et al. Humidity effects on scanning polarization force microscopy imaging[J]. APPLIED SURFACE SCIENCE,2017,412:497-504. |
APA | Shen, Yue.,Zhou, Yuan.,Sun, Yanxia.,Zhang, Lijuan.,Wang, Ying.,...&Zhang, Yi.(2017).Humidity effects on scanning polarization force microscopy imaging.APPLIED SURFACE SCIENCE,412,497-504. |
MLA | Shen, Yue,et al."Humidity effects on scanning polarization force microscopy imaging".APPLIED SURFACE SCIENCE 412(2017):497-504. |
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