Dislocation distributions and tilts in Al(Ga) InAs reverse-graded layers grown on misorientated GaAs substrates
He, Yang(何洋); Sun, Yu-run(孙玉润); Zhao, Yongming(赵勇明); Yu, Shuzhen(于淑珍); Dong, Jianrong(董建荣); Dong JR(董建荣)
刊名CHINESE PHYSICS B
2017
语种英语
内容类型期刊论文
源URL[http://ir.sinano.ac.cn/handle/332007/5354]  
专题苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_董建荣团队
通讯作者Dong JR(董建荣)
推荐引用方式
GB/T 7714
He, Yang,Sun, Yu-run,Zhao, Yongming,et al. Dislocation distributions and tilts in Al(Ga) InAs reverse-graded layers grown on misorientated GaAs substrates[J]. CHINESE PHYSICS B,2017.
APA He, Yang,Sun, Yu-run,Zhao, Yongming,Yu, Shuzhen,Dong, Jianrong,&董建荣.(2017).Dislocation distributions and tilts in Al(Ga) InAs reverse-graded layers grown on misorientated GaAs substrates.CHINESE PHYSICS B.
MLA He, Yang,et al."Dislocation distributions and tilts in Al(Ga) InAs reverse-graded layers grown on misorientated GaAs substrates".CHINESE PHYSICS B (2017).
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