Aberration correction for improving the image quality in STED microscopy using the genetic algorithm | |
Wang, Luwei3; Yan, Wei3; Li, Runze4; Weng, Xiaoyu3; Zhang, Jia3; Yang, Zhigang3; Liu, Liwei3; Ye, Tong1,2; Qu, Junle3 | |
刊名 | NANOPHOTONICS |
2018-12 | |
卷号 | 7期号:12页码:1971-1980 |
关键词 | Aberration Adaptive Optics Genetic Algorithm Super-resolution Imaging |
ISSN号 | 2192-8606;2192-8614 |
DOI | 10.1515/nanoph-2018-0133 |
产权排序 | 4 |
英文摘要 | With a purely optical modulation of fluorescent behaviors, stimulated emission depletion (STED) microscopy allows for far-field imaging with a diffraction-unlimited resolution in theory. The performance of STED microscopy is affected by many factors, of which aberrations induced by the optical system and biological samples can distort the wave front of the depletion beam at the focal plane to greatly deteriorate the spatial resolution and the image contrast. Therefore, aberration correction is imperative for STED imaging, especially for imaging thick specimens. Here, we present a wave front compensation approach based on the genetic algorithm (GA) to restore the distorted laser wave front for improving the quality of STED images. After performing aberration correction on two types of zebrafish samples, the signal intensity and the imaging resolution of STED images were both improved, where the thicknesses were 24 pm and 100 pm in the zebrafish retina sample and the zebrafish embryo sample, respectively. The results showed that the GA-based wave front compensation approach has the capability of correction for both system-induced and sample-induced aberrations. The elimination of aberrations can prompt STED imaging in deep tissues; therefore, STED microscopy can be expected to play an increasingly important role in super-resolution imaging related to the scientific research in biological fields. |
语种 | 英语 |
出版者 | WALTER DE GRUYTER GMBH |
WOS记录号 | WOS:000451084700009 |
内容类型 | 期刊论文 |
源URL | [http://ir.opt.ac.cn/handle/181661/30740] |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
通讯作者 | Ye, Tong |
作者单位 | 1.Clemson Univ, Dept Bioengn, Clemson, SC 29634 USA 2.Clemson Univ, COMSET, Clemson, SC 29634 USA 3.Shenzhen Univ, Coll Optoelect Engn, Minist Educ & Guangdong Prov, Key Lab Optoelect Devices & Syst, Shenzhen 518060, Peoples R China 4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Shaanxi, Peoples R China |
推荐引用方式 GB/T 7714 | Wang, Luwei,Yan, Wei,Li, Runze,et al. Aberration correction for improving the image quality in STED microscopy using the genetic algorithm[J]. NANOPHOTONICS,2018,7(12):1971-1980. |
APA | Wang, Luwei.,Yan, Wei.,Li, Runze.,Weng, Xiaoyu.,Zhang, Jia.,...&Qu, Junle.(2018).Aberration correction for improving the image quality in STED microscopy using the genetic algorithm.NANOPHOTONICS,7(12),1971-1980. |
MLA | Wang, Luwei,et al."Aberration correction for improving the image quality in STED microscopy using the genetic algorithm".NANOPHOTONICS 7.12(2018):1971-1980. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论