Performance test and image correction of CMOS image sensor in radiation environment

doi:10.1117/12.2243427

CORC > 光电技术研究所 > 中国科学院光电技术研究所 > 微电子装备总体研究室（四室）

	Performance test and image correction of CMOS image sensor in radiation environment
	Wang, Congzheng 1,2,3; Hu, Song 1; Gao, Chunming 2; Feng, Chang 1
刊名	Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment
	2016
卷号	9684 页码:96841H
关键词	Cmos Integrated Circuits Digital Cameras Digital Storage Equipment Gamma Rays Image Reconstruction Image Sensors Ionizing Radiation Manufacture Optical Data Processing Optical Testing Pixels Radiation Signal To Noise Ratio
ISSN号	0277-786X
DOI	10.1117/12.2243427
文献子类	C
英文摘要	CMOS image sensors rival CCDs in domains that include strong radiation resistance as well as simple drive signals, so it is widely applied in the high-energy radiation environment, such as space optical imaging application and video monitoring of nuclear power equipment. However, the silicon material of CMOS image sensors has the ionizing dose effect in the high-energy rays, and then the indicators of image sensors, such as signal noise ratio (SNR), non-uniformity (NU) and bad point (BP) are degraded because of the radiation. The radiation environment of test experiments was generated by the60Co γ-rays source. The camera module based on image sensor CMV2000 from CMOSIS Inc. was chosen as the research object. The ray dose used for the experiments was with a dose rate of 20krad/h. In the test experiences, the output signals of the pixels of image sensor were measured on the different total dose. The results of data analysis showed that with the accumulation of irradiation dose, SNR of image sensors decreased, NU of sensors was enhanced, and the number of BP increased. The indicators correction of image sensors was necessary, as it was the main factors to image quality. The image processing arithmetic was adopt to the data from the experiences in the work, which combined local threshold method with NU correction based on non-local means (NLM) method. The results from image processing showed that image correction can effectively inhibit the BP, improve the SNR, and reduce the NU. © 2016 SPIE.
语种	英语
WOS记录号	WOS:000387429500053
资助机构	Chinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS)
内容类型	期刊论文
源URL	[http://ir.ioe.ac.cn/handle/181551/8510]
专题	光电技术研究所_微电子装备总体研究室（四室）
作者单位	1.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 2.610209, China 3.School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 4.610054, China 5.University of Chinese Academy of Sciences, Beijing 6.100049, China
推荐引用方式 GB/T 7714	Wang, Congzheng,Hu, Song,Gao, Chunming,et al. Performance test and image correction of CMOS image sensor in radiation environment[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment,2016,9684:96841H.
APA	Wang, Congzheng,Hu, Song,Gao, Chunming,&Feng, Chang.(2016).Performance test and image correction of CMOS image sensor in radiation environment.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment,9684,96841H.
MLA	Wang, Congzheng,et al."Performance test and image correction of CMOS image sensor in radiation environment".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment 9684(2016):96841H.