Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation

	Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation
	Ehsan Nasr Esfahani; Ahmad Eshghineja; Yun Ou; Jinjin Zhao; Stuart Adler; Jiangyu Li
刊名	Microscopy Today
	2017
文献子类	期刊论文
英文摘要	A universal challenge facing the development of electrochemical materials is our lack of understanding of physical and chemical processes at local length scales in the 10–100 nm regime, and acquiring this understanding requires a new generation of imaging techniques. In this article, we introduce the scanning thermo-ionic microscopy (STIM) for probing local electrochemistry at the nanoscale, using for imaging the Vegard strain induced via thermal stress excitations. Since ionic oscillation is driven by the stress instead of voltage, the responses are insensitive to the electromechanical,electrostatic, and capacitive effects, and they are immune to global current perturbation, making in-operando testing possible.
URL标识	查看原文
语种	英语
内容类型	期刊论文
源URL	[http://ir.siat.ac.cn:8080/handle/172644/12130]
专题	深圳先进技术研究院_医工所
作者单位	Microscopy Today
推荐引用方式 GB/T 7714	Ehsan Nasr Esfahani,Ahmad Eshghineja,Yun Ou,et al. Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation[J]. Microscopy Today,2017.
APA	Ehsan Nasr Esfahani,Ahmad Eshghineja,Yun Ou,Jinjin Zhao,Stuart Adler,&Jiangyu Li.(2017).Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation.Microscopy Today.
MLA	Ehsan Nasr Esfahani,et al."Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation".Microscopy Today (2017).