Relationship between dislocations and misfit strain relaxation in InGaAs/GaAs heterostructures
Li, J. P.; G. Q. Miao; Y. G. Zeng; Z. W. Zhang; D. B. Li; H. Song; H. Jiang; Y. R. Chen; X. J. Sun and Z. M. Li
刊名Crystengcomm
2017
卷号19期号:1
英文摘要Large lattice mismatched heterostructures In0.78Ga0.22As/GaAs were grown with a low-temperature (LT) InGaAs buffer. Misfit dislocation arrays were observed at the LT-buffer/GaAs interfaces. Transmission electron microscopy (TEM) was used to investigate the microstructures of the heterointerfaces. The relationship between misfit dislocations and strain relaxation at the interface was analysed. It was found that strain redistribution gives rise to the discrepancy of interfacial structure and misfit strain relaxation for different samples. The experimental results are in favor of the conclusion and confirm the analysis we proposed.
语种英语
内容类型期刊论文
源URL[http://ir.ciomp.ac.cn/handle/181722/59005]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出
推荐引用方式
GB/T 7714
Li, J. P.,G. Q. Miao,Y. G. Zeng,et al. Relationship between dislocations and misfit strain relaxation in InGaAs/GaAs heterostructures[J]. Crystengcomm,2017,19(1).
APA Li, J. P..,G. Q. Miao.,Y. G. Zeng.,Z. W. Zhang.,D. B. Li.,...&X. J. Sun and Z. M. Li.(2017).Relationship between dislocations and misfit strain relaxation in InGaAs/GaAs heterostructures.Crystengcomm,19(1).
MLA Li, J. P.,et al."Relationship between dislocations and misfit strain relaxation in InGaAs/GaAs heterostructures".Crystengcomm 19.1(2017).
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace