Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench

	Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench
	D.Obradors.Campos; M.B.Ahedo; J.M.Barcala; J.Calero; P.Calvo; M.A.Domínguez; E.F.Estévez; J.M.Figarola; L.García.Tabarés; D.Gavela
	2017
会议日期	2017
会议地点	Denmark
会议录	Proceedings of the 8th International Particle Accelerator Conference
内容类型	会议论文
源URL	[http://ir.ihep.ac.cn/handle/311005/262102]
专题	学术会议_国际参会_JaCoW高能所参会会议_IPAC
作者单位	CIEMAT, Madrid, Spain
推荐引用方式 GB/T 7714	D.Obradors.Campos,M.B.Ahedo,J.M.Barcala,et al. Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench[C]. 见:. Denmark. 2017.