Research on the Defects Identify of the Weld-line's Image of the In-service Pipeline Based on BP Neural Network
Yuan, Gao; Yin J(尹健); Wang ZW(王照伟); Ceng P(曾鹏); Li D(李栋); Yu HB(于海斌); Liu JD(刘金娣)
2017
会议名称1st International Conference on Electronics Instrumentation & Information Systems (EIIS)
会议日期June 3-5, 2017
会议地点Harbin, China
关键词Welding-line defects BP neural network Image recognition
页码366-371
通讯作者Yin J(尹健)
中文摘要This paper applied computer aided technique to do the image recognition work of the welding-line's defects. And this paper uses aspect ratio, roundness, compactness, symmetry, steepness, gray contrast of defect and the background, position of the defect as the defects' eigenvalues. And this paper applied BP neural network to recognize the defects. And experiments are used to get the best values of the eigenvalues.
收录类别CPCI(ISTP)
产权排序1
会议主办者IEEE Harbin Sect
会议录PROCEEDINGS FIRST INTERNATIONAL CONFERENCE ON ELECTRONICS INSTRUMENTATION & INFORMATION SYSTEMS (EIIS 2017)
会议录出版者IEEE
会议录出版地New York
语种英语
ISBN号978-1-5386-0843-2
WOS记录号WOS:000426992300063
内容类型会议论文
源URL[http://ir.sia.cn/handle/173321/22028]  
专题沈阳自动化研究所_工业控制网络与系统研究室
作者单位1.Intelligent Detection and Equipment Department, Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, China, 110016
2.Open Pit Engineering Division, CCTEG Shenyang Engineering Company, Shenyang, China, 110015
推荐引用方式
GB/T 7714
Yuan, Gao,Yin J,Wang ZW,et al. Research on the Defects Identify of the Weld-line's Image of the In-service Pipeline Based on BP Neural Network[C]. 见:1st International Conference on Electronics Instrumentation & Information Systems (EIIS). Harbin, China. June 3-5, 2017.
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