Micro-scale (similar to 10 mu m) analyses of rare earth elements in silicate glass, zircon and apatite with NanoSIMS | |
Zhang, Jianchao; Lin, Yangting; Yang, Wei; Hao, Jialong; Hu, Sen | |
刊名 | INTERNATIONAL JOURNAL OF MASS SPECTROMETRY |
2016-08-01 | |
卷号 | 406页码:48-54 |
关键词 | Rare earth element NanoSIMS Apatite Zircon Silicate glass |
DOI | 10.1016/j.ijms.2016.06.004 |
文献子类 | Article |
英文摘要 | Micron-scale (-10 mu m) analyses of rare earth elements (REEs) in silicate glass, zircon and apatite were carried with nano-scale secondary ion mass spectrometer (NanoSIMS) operating at high mass resolution mode (m/Delta m = similar to 10000, 10%), which eliminating isobaric interferences of heavy REEs by light REE monoxides. To achieve high lateral resolution, the primary O- probe was optimized to a current of similar to 1 nA and a diameter <2.5 mu m, scanning over the analysis area of 5 x 5 mu m(2) or 10 x 10 mu m(2). The analyses were conducted at a combined mode of multi-collection and peak-jumping to improve the analytical efficiency. Fifteen ion species including rare earth elements and a reference element (Si or Ca) were counted through 4 times of magnetic field switch. The standards of NIST glass, apatite and zircon were analyzed in this study, which represent flat patterns, LREE-enriched and LREE-depleted and show different matrix effects. The relative sensitivity factors (RSF) of REEs are higher in zircon than NIST glass by a factor of 20-50% referred to Si-30(+), and they are higher in apatite than NIST glass by a factor of 2-3 referred to Ca-42(+). Therefore, the absolute concentration of REEs could be only calibrated with the matrix-matched mineral standards in the SIMS analysis. The analytical reproducibilities (1SD) were <5% for silicate glass (NIST SRM 610), <10% for apatite (Durango) and <15% for zircon (M257). The analytical accuracies determined from the measurements of the standards NIST glass (NIST SRM 612), apatite (MAD and Otter lake) and zircon (91500) were better than 10%, 20% and 30%, respectively, except for La interfered by ZrSiO and ZrO3 for zircon. (C) 2016 Elsevier B.V. All rights reserved. |
WOS关键词 | PLASMA-MASS SPECTROMETRY ; LASER-ABLATION ICPMS ; NIST SRM 610 ; U-PB AGE ; ION MICROPROBE ; TRACE-ELEMENTS ; GEOCHRONOLOGY ; CONSTRAINTS ; MINERALS ; RATIOS |
WOS研究方向 | Physics ; Spectroscopy |
语种 | 英语 |
WOS记录号 | WOS:000382349800007 |
资助机构 | Natural Science Foundation of China(41503012 ; Natural Science Foundation of China(41503012 ; 41430105 ; 41430105 ; 41273077 ; 41273077 ; 41173075) ; 41173075) ; Natural Science Foundation of China(41503012 ; Natural Science Foundation of China(41503012 ; 41430105 ; 41430105 ; 41273077 ; 41273077 ; 41173075) ; 41173075) |
内容类型 | 期刊论文 |
源URL | [http://ir.iggcas.ac.cn/handle/132A11/53319] |
专题 | 地质与地球物理研究所_中国科学院地球与行星物理重点实验室 |
作者单位 | Chinese Acad Sci, Inst Geol & Geophys, Key Lab Earth & Planetary Phys, Beijing 100029, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, Jianchao,Lin, Yangting,Yang, Wei,et al. Micro-scale (similar to 10 mu m) analyses of rare earth elements in silicate glass, zircon and apatite with NanoSIMS[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY,2016,406:48-54. |
APA | Zhang, Jianchao,Lin, Yangting,Yang, Wei,Hao, Jialong,&Hu, Sen.(2016).Micro-scale (similar to 10 mu m) analyses of rare earth elements in silicate glass, zircon and apatite with NanoSIMS.INTERNATIONAL JOURNAL OF MASS SPECTROMETRY,406,48-54. |
MLA | Zhang, Jianchao,et al."Micro-scale (similar to 10 mu m) analyses of rare earth elements in silicate glass, zircon and apatite with NanoSIMS".INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 406(2016):48-54. |
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