Optical thickness measurement with single-shot dual-wavelength in-line digital holography

doi:10.1364/OL.43.004469

CORC > 西安光学精密机械研究所 > 中国科学院西安光学精密机械研究所 > 瞬态光学技术国家重点实验室

	Optical thickness measurement with single-shot dual-wavelength in-line digital holography
	Min, Junwei 1,2; Zhou, Meiling 1; Yuan, Xun 1; Wen, Kai 1,3; Yu, Xianghua 1,2; Peng, Tong 1,2; Yao, Baoli 1,2
刊名	Optics Letters
	2018-09-15
卷号	43 期号:18 页码:4469-4472
ISSN号	01469592;15394794
DOI	10.1364/OL.43.004469
产权排序	1
英文摘要	An algorithm for quantitative reconstruction of the optical thickness distribution of objects is proposed based on single-shot dual-wavelength in-line digital holography. Two single-wavelength holograms can be extracted from a single-shot recorded dual-wavelength in-line hologram. The quantitative optical thickness distribution of the specimen can be reconstructed directly without calculations of the phase images at every single wavelength. Thus, off-axis recording and phase-shifting operation are not required, enabling a fast and high-resolution measurement. The effectiveness and accuracy of the proposed method are verified by both numerical simulations and experimental results. ? 2018 Optical Society of America
语种	英语
出版者	OSA - The Optical Society
WOS记录号	WOS:000444400100040
内容类型	期刊论文
源URL	[http://ir.opt.ac.cn/handle/181661/30633]
专题	西安光学精密机械研究所_瞬态光学技术国家重点实验室
通讯作者	Yao, Baoli
作者单位	1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China; 2.Xi’an Jiaotong University, No. 28 Xianning West Road, Xi’an; 710049, China; 3.College of Physics and Information Technology, Shaanxi Normal University, Xi’an; 710071, China
推荐引用方式 GB/T 7714	Min, Junwei,Zhou, Meiling,Yuan, Xun,et al. Optical thickness measurement with single-shot dual-wavelength in-line digital holography[J]. Optics Letters,2018,43(18):4469-4472.
APA	Min, Junwei.,Zhou, Meiling.,Yuan, Xun.,Wen, Kai.,Yu, Xianghua.,...&Yao, Baoli.(2018).Optical thickness measurement with single-shot dual-wavelength in-line digital holography.Optics Letters,43(18),4469-4472.
MLA	Min, Junwei,et al."Optical thickness measurement with single-shot dual-wavelength in-line digital holography".Optics Letters 43.18(2018):4469-4472.