Influence of Overlapping Rate of Focused Femtosecond Laser Spot on the Silicon Surfaces Colorization
Li HJ(李虹瑾); Bo F(柏锋); Fan WZ(范文中); Li YB(李阳博); Pan HH(泮怀海); Zhao QZ(赵全忠)
刊名中国激光
2016
卷号43期号:7页码:703001
通讯作者fbai@siom.ac.cn ; zqz@siom.ac.cn
中文摘要研究了光斑重叠率对飞秒激光硅材料表面着色的影响。实验结果表明:飞秒激光在硅材料表面着色是由于在其表面诱导出了周期纳米条纹结构;在飞秒激光功率一定的情况下,较高和较低的光斑重叠率都不能实现着色;在选定激光功率范围内,光斑重叠率越大,呈现的颜色越丰富,着色效率越高。另外反射率的测量结果表明着色后样品在可见光范围内反射率下降了50%左右。得到了飞秒激光硅材料表面着色的参数窗口,为飞秒激光半导体着色的推广提供了技术参考。
英文摘要The influence of overlapping rate of focused femtosecond laser spot on colorization of silicon surfaces is investigated.Experimental results indicate that the generation of periodic nanoscale ripple structures induced by femtosecond laser pulses is responsible for the silicon surfaces colorization.In the case of a certain femtosecond laser power,the colorization cannot be realized with too high or too low overlapping rate of focused laser spots.For a special range of laser power,the denser overlapping rate of focused laser spots,the more colors are observed,and the higher colorization efficiency is achieved.In addition,the measurement results of reflection indicate that the refection rate of colorized samples reduces about 50%in the visible light range.The window parameters for silicon surfaces colorization by femtosecond laser are obtained,which paves the way for femtosecond laser semiconductor colorizing technology.
收录类别CSCD
资助信息国家自然科学基金
CSCD记录号CSCD:5765094
WOS记录号CSCD:5765094
内容类型期刊论文
源URL[http://ir.siom.ac.cn/handle/181231/28643]  
专题上海光学精密机械研究所_强场激光物理国家重点实验室
作者单位中国科学院上海光学精密机械研究所
推荐引用方式
GB/T 7714
Li HJ,Bo F,Fan WZ,et al. Influence of Overlapping Rate of Focused Femtosecond Laser Spot on the Silicon Surfaces Colorization[J]. 中国激光,2016,43(7):703001.
APA 李虹瑾,柏锋,范文中,李阳博,泮怀海,&赵全忠.(2016).Influence of Overlapping Rate of Focused Femtosecond Laser Spot on the Silicon Surfaces Colorization.中国激光,43(7),703001.
MLA 李虹瑾,et al."Influence of Overlapping Rate of Focused Femtosecond Laser Spot on the Silicon Surfaces Colorization".中国激光 43.7(2016):703001.
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