Planation surface extraction and quantitative analysis based on high-resolution digital elevation models

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	Planation surface extraction and quantitative analysis based on high-resolution digital elevation models
	Wang, YX; Pan, BT; Gao, HS; Liu, Y
	2005
会议名称	25th IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2005)
会议日期	JUL 25-29, 2005
会议地点	Seoul, SOUTH KOREA
页码	5369-5371
通讯作者	Wang, YX (reprint author), Lanzhou Univ, Minist Educ, Key Lab Western Chinas Environm Syst, Lanzhou 730000, Peoples R China.
会议录	IGARSS 2005: IEEE International Geoscience and Remote Sensing Symposium, Vols 1-8, Proceedings
会议录出版地	NEW YORK
学科主题	Geology; Remote Sensing
语种	英语
WOS记录号	WOS:000237237607014
内容类型	会议论文
源URL	[http://ir.lzu.edu.cn/handle/262010/184408]
专题	资源环境学院_会议论文
推荐引用方式 GB/T 7714	Wang, YX,Pan, BT,Gao, HS,et al. Planation surface extraction and quantitative analysis based on high-resolution digital elevation models[C]. 见:25th IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2005). Seoul, SOUTH KOREA. JUL 25-29, 2005.