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An approach to mutation-based test data generation
Wang, Fang; Rina, Wu; Lee, Shu Fang; Zheng, Tian Hua
2013
会议名称2013 International Conference on Precision Mechanical Instruments and Measurement Technology, ICPMIMT 2013
会议日期May 25, 2013 - May 26, 2013
会议地点Shenyang, Liaoning, China
关键词Software testing Data communication systems Design Testing Design approaches Fault simulation Mutation operators Mutation testing Quality of softwares Software defects Test data Test data generation
卷号347-350
页码491-495
会议录Applied Mechanics and Materials
会议录出版地Zurich-Durnten
学科主题Computer Applications; Computer Software, Data Handling and Applications; Telephone Systems and Related Technologies; Line Communications; Telecommunication; Radar, Radio and Television
语种英语
ISSN号1660-9336
内容类型会议论文
源URL[http://ir.lzu.edu.cn/handle/262010/183754]  
专题信息科学与工程学院_会议论文
推荐引用方式
GB/T 7714
Wang, Fang,Rina, Wu,Lee, Shu Fang,et al. An approach to mutation-based test data generation[C]. 见:2013 International Conference on Precision Mechanical Instruments and Measurement Technology, ICPMIMT 2013. Shenyang, Liaoning, China. May 25, 2013 - May 26, 2013.
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