Growth of controlled thickness graphene by ion implantation for field-effect transistor | |
Wang, G; Ding, GQ; Zhu, Y; Chen, D; Ye, L; Zheng, L; Zhang, M; Di, ZF; Liu, S | |
刊名 | MATERIALS LETTERS |
2013-09-15 | |
卷号 | 107页码:170-173 |
关键词 | Graphene Raman Controlled thickness Electrical properties Semiconductors |
ISSN号 | 0167-577X |
通讯作者 | Liu, S (reprint author), Lanzhou Univ, Sch Phys Sci & Technol, 222 Tianshui, Lanzhou 730000, Peoples R China. |
学科主题 | Materials Science; Physics |
语种 | 英语 |
WOS记录号 | WOS:000323240300048 |
内容类型 | 期刊论文 |
源URL | [http://202.201.7.4/handle/262010/105897] |
专题 | 物理科学与技术学院_期刊论文 |
推荐引用方式 GB/T 7714 | Wang, G,Ding, GQ,Zhu, Y,et al. Growth of controlled thickness graphene by ion implantation for field-effect transistor[J]. MATERIALS LETTERS,2013,107:170-173. |
APA | Wang, G.,Ding, GQ.,Zhu, Y.,Chen, D.,Ye, L.,...&Liu, S.(2013).Growth of controlled thickness graphene by ion implantation for field-effect transistor.MATERIALS LETTERS,107,170-173. |
MLA | Wang, G,et al."Growth of controlled thickness graphene by ion implantation for field-effect transistor".MATERIALS LETTERS 107(2013):170-173. |
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