QQ客服 官方微博 反馈留言

	Nonequilibrium charge carrier lifetime testing equipment for semiconductor materials by a contactless microwave phase method
	Chen, Song ; Ni, Zurong ; Xiao, Fen ; Xiao F(肖芬)
	2013
关键词	Carrier lifetime Industrial engineering Production engineering
英文摘要	Conference Name:2012 3rd International Conference on Advances in Materials and Manufacturing Processes, ICAMMP 2012. Conference Address: Beihai, China. Time:December 22, 2012 - December 23, 2012.; University of Wollongong, Australia; Northeastern University, China; University of Science and Technology Beijing; Hong Kong Industrial Technology Research Centre; The accurate measurement of nonequilibrium charge carrier lifetime is of vital significance in research and manufacture of crystalline silicon solar cells. A testing equipment based on a contactless microwave phase method was implemented by being embedded with GPIB, FPGA and a lock-in analyzer. A friendly operation interface was developed, based on the graphic programming language LabVIEW. The virtue of the equipment is achieved by automatic data acquisition and processing, which improves the automatization, efficiency and accuracy of the measurement. ? (2013) Trans Tech Publications, Switzerland.
语种	英语
出处	http://dx.doi.org/10.4028/www.scientific.net/AMR.655-657.830
出版者	Trans Tech Publications
内容类型	其他
源URL	[http://dspace.xmu.edu.cn/handle/2288/86115]
专题	物理技术－会议论文
推荐引用方式 GB/T 7714	Chen, Song,Ni, Zurong,Xiao, Fen,et al. Nonequilibrium charge carrier lifetime testing equipment for semiconductor materials by a contactless microwave phase method. 2013-01-01.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。