Normal incidence p-i-n Ge heterojunction photodiodes on Si substrate grown by ultrahigh vacuum chemical vapor deposition | |
Zhou, ZW ; He, JK ; Wang, RC ; Li, C ; Yu, JZ ; Li C(李成) | |
刊名 | http://dx.doi.org/10.1016/j.optcom.2010.04.098 |
2010-09-15 | |
关键词 | SI(100) |
英文摘要 | National Basic Research Program of China (973 Program) [2007CB613404]; Program for New Century Excellent Talents in University; We report on normal incidence p-i-n heterojunction photodiodes operating in the near-infrared region and realized in pure germanium on planar silicon substrate. The diodes were fabricated by ultrahigh vacuum chemical vapor deposition at 600 degrees C without thermal annealing and allowing the integration with standard silicon processes. Due to the 0.14% residual tensile strain generated by the thermal expansion mismatch between Ge and Si, an efficiency enhancement of nearly 3-fold at 1.55 mu m and the absorption edge shifting to longer wavelength of about 40 nm are achieved in the epitaxial Ge films. The diode with a responsivity of 0.23 A/W at 1.55 mu m wavelength and a bulk dark current density of 10 mA/cm(2) is demonstrated. These diodes with high performances and full compatibility with the CMOS processes enable monolithically integrating microphotonics and microelectronics on the same chip. (C) 2010 Elsevier B.V. All rights reserved. |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://dspace.xmu.edu.cn/handle/2288/69555] |
专题 | 物理技术-已发表论文 |
推荐引用方式 GB/T 7714 | Zhou, ZW,He, JK,Wang, RC,et al. Normal incidence p-i-n Ge heterojunction photodiodes on Si substrate grown by ultrahigh vacuum chemical vapor deposition[J]. http://dx.doi.org/10.1016/j.optcom.2010.04.098,2010. |
APA | Zhou, ZW,He, JK,Wang, RC,Li, C,Yu, JZ,&李成.(2010).Normal incidence p-i-n Ge heterojunction photodiodes on Si substrate grown by ultrahigh vacuum chemical vapor deposition.http://dx.doi.org/10.1016/j.optcom.2010.04.098. |
MLA | Zhou, ZW,et al."Normal incidence p-i-n Ge heterojunction photodiodes on Si substrate grown by ultrahigh vacuum chemical vapor deposition".http://dx.doi.org/10.1016/j.optcom.2010.04.098 (2010). |
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