Degradation-based burn-in planning under competing risks

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	Degradation-based burn-in planning under competing risks
	Ye, Zhi-Sheng ; Xie, Min ; Shen, Yan ; Tang, Loon-Ching ; Shen Y(沈雁)
刊名	http://dx.doi.org/10.1080/00401706.2012.676946
	2012
关键词	Failure modes Parameter estimation Thermoelectric equipment
英文摘要	Motivated by two real-life examples, this article develops a burn-in planning framework with competing risks. Existing approaches to planning burn-in tests are confined to a single failure mode based on the assumption that this failure mode is subject to infant mortality. Considering the prevalence of competing risks and the high reliability of modern products, our framework differentiates between normal and infant mortality failure modes and recommends degradation-based burn-in approaches. This framework is employed to guide the burn-in planning for an electronic device subject to both a degradation- threshold failure, which is an infant mortality mode and can be modeled by a gamma process with random effect, and a catastrophic mode, which is normal and can be represented with a conventional reliability model. Three degradation-based burn-in models are built and the optimal cutoff degradation levels are derived. Their validity is demonstrated by an electronic device example. We also propose three approaches to deal with uncertainty due to parameter estimation. Algorithmic details and proofs are provided in supplementary material online. 漏 2012 American Statistical Association and the American Society for Quality.
语种	英语
出版者	American Statistical Association
内容类型	期刊论文
源URL	[http://dspace.xmu.edu.cn/handle/2288/90205]
专题	经济学院－已发表论文
推荐引用方式 GB/T 7714	Ye, Zhi-Sheng,Xie, Min,Shen, Yan,et al. Degradation-based burn-in planning under competing risks[J]. http://dx.doi.org/10.1080/00401706.2012.676946,2012.
APA	Ye, Zhi-Sheng,Xie, Min,Shen, Yan,Tang, Loon-Ching,&沈雁.(2012).Degradation-based burn-in planning under competing risks.http://dx.doi.org/10.1080/00401706.2012.676946.
MLA	Ye, Zhi-Sheng,et al."Degradation-based burn-in planning under competing risks".http://dx.doi.org/10.1080/00401706.2012.676946 (2012).