Characterization of Microwave Ceramics with Low Permittivity and High Quality Factors

CORC > 厦门大学 > 材料学院－已发表论文

	Characterization of Microwave Ceramics with Low Permittivity and High Quality Factors
	Xiong, Z. X. ; Zhou, M. Y. ; Xue, H. ; Qiu, H. ; Xiao, F. ; Pan, W ; Gong, J ; Xiong ZX(熊兆贤)
刊名	http://dx.doi.org/10.4028/www.scientific.net/KEM.434-435.244
	2010
关键词	Microwave ceramics Dielectric property Mechanical performance
英文摘要	A new type of porous ceramics, Mg(2)SiO(4), for microwave application with low permittivity and high quality factors were prepared via gel-casting processing in this paper. Microstructure of the ceramics was observed and crystal structure of the samples was also identified. Moreover, emphasis was paid on the characterization of the microwave ceramics. Dielectric properties of the ceramics were measured by an automatic system of microwave measurement, resulting in dielectric constant of 3.51 and quality factor of 11,774 for the ceramic sample at frequency about 10GHz. Mechanical performance of the samples were also evaluated with maximal bending strength of 140MPa.
语种	英语
内容类型	期刊论文
源URL	[http://dspace.xmu.edu.cn/handle/2288/59662]
专题	材料学院－已发表论文
推荐引用方式 GB/T 7714	Xiong, Z. X.,Zhou, M. Y.,Xue, H.,et al. Characterization of Microwave Ceramics with Low Permittivity and High Quality Factors[J]. http://dx.doi.org/10.4028/www.scientific.net/KEM.434-435.244,2010.
APA	Xiong, Z. X..,Zhou, M. Y..,Xue, H..,Qiu, H..,Xiao, F..,...&熊兆贤.(2010).Characterization of Microwave Ceramics with Low Permittivity and High Quality Factors.http://dx.doi.org/10.4028/www.scientific.net/KEM.434-435.244.
MLA	Xiong, Z. X.,et al."Characterization of Microwave Ceramics with Low Permittivity and High Quality Factors".http://dx.doi.org/10.4028/www.scientific.net/KEM.434-435.244 (2010).