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	Temperature-aware NBTI modeling techniques in digital circuits
	Hong Luo ; Yu Wang ; Rong Luo ; Huazhong Yang ; Yuan Xie
	2010-10-12 ; 2010-10-12
关键词	Practical Theoretical or Mathematical/ CMOS digital integrated circuits integrated circuit modelling integrated circuit reliability thermal stability/ temperature-aware NBTI modeling technique digital circuits negative bias temperature instability circuit reliability CMOS technology PMOS V/sub th/ degradation model ISCAS85 benchmark circuits/ B2570D CMOS integrated circuits B1265A Digital circuit design, modelling and testing B2570A Semiconductor integrated circuit design, layout, modelling and testing B0170N Reliability
中文摘要	Negative bias temperature instability (NBTI) has become a critical reliability phenomena in advanced CMOS technology. In this paper, we propose an analytical temperature-aware dynamic NBTI model, which can be used in two circuit operation cases: executing tasks with different temperatures, and switching between active and standby mode. A PMOS V/sub th/ degradation model and a digital circuits' temporal performance degradation estimation method are developed based on our NBTI model. The simulation results show that: 1) the execution of a low temperature task can decrease Delta V/sub th/, due to NBTI by 24.5%; 2) switching to standby mode can decrease Delta V/sub th/ by 52.3%; 3) for ISCAS85 benchmark circuits, the delay degradation can decrease significantly if the circuit execute low temperature task or switch to standby mode and 4) we have also observed the execution time's ratio of different tasks and the ratio of active to standby time both have a considerable impact on NBTI effect.
语种	英语
出版者	IEICE ; Japan
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/82621]
专题	清华大学
推荐引用方式 GB/T 7714	Hong Luo,Yu Wang,Rong Luo,et al. Temperature-aware NBTI modeling techniques in digital circuits[J],2010, 2010.
APA	Hong Luo,Yu Wang,Rong Luo,Huazhong Yang,&Yuan Xie.(2010).Temperature-aware NBTI modeling techniques in digital circuits..
MLA	Hong Luo,et al."Temperature-aware NBTI modeling techniques in digital circuits".(2010).

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