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	Low count bias in gamma ray thickness detection and its correction
	Liang, Manchun ; Kang, Kejun ; Zhang, Zhikang ; Lou, Xinghua
	2010-05-10 ; 2010-05-10
关键词	low count bias thickness measurement biased estimate Instruments & Instrumentation Nuclear Science & Technology Physics, Particles & Fields Spectroscopy
中文摘要	In this paper we introduce the latest discovery of Low Count Bias (LCB) effect in gamma ray material thickness measurement, which adversely affects the precision of measurement. Theoretical analysis of LCB effect is presented and the correction method is proposed. In order to further prove our theory, Monte Carlo simulation is taken and the result of bias correction is given. (c) 2006 Elsevier B.V. All rights reserved.
语种	英语 ; 英语
出版者	ELSEVIER SCIENCE BV ; AMSTERDAM ; PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
内容类型	期刊论文
源URL	[http://hdl.handle.net/123456789/22145]
专题	清华大学
推荐引用方式 GB/T 7714	Liang, Manchun,Kang, Kejun,Zhang, Zhikang,et al. Low count bias in gamma ray thickness detection and its correction[J],2010, 2010.
APA	Liang, Manchun,Kang, Kejun,Zhang, Zhikang,&Lou, Xinghua.(2010).Low count bias in gamma ray thickness detection and its correction..
MLA	Liang, Manchun,et al."Low count bias in gamma ray thickness detection and its correction".(2010).

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