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	CCD-based on-line thickness measurement system for calender
	Guo Lifeng ; Fan Yuming ; Zhang Guoxiong ; Chen Ken
	2010-05-10 ; 2010-05-10
会议名称	Proceedings of the SPIE - The International Society for Optical Engineering ; Optical Design and Testing III ; Beijing, China ; INSPEC
关键词	Practical Experimental/ calenders CCD image sensors data acquisition error compensation microcontrollers neural nets thickness measurement/ on-line calender thickness measurement linear CCD optical projection method collimated light quadratic differentiating circuit pulse width measurement programmable counter array microcontroller integrated CCD sensor module 2-D coordinate data acquisition module distributed automatic data acquisition control system error compensation method multilayer feedforward neural network/ A0630C Spatial variables measurement A4280Q Image detectors, convertors, and intensifiers B7320C Spatial variables measurement B7230G Image sensors B1265F Microprocessors and microcomputers
中文摘要	An on-line calender thickness measurement system based on linear CCD is proposed. In this system, an optical projection method based on collimated light and CCD is used to realize the thickness measurement for sheet product. To test the accurate position of the edge of the sheet projection, a quadratic differentiating circuit and an accurate pulse width measurement method based on programmable counter array are used to deal with the CCD signals, which make the resolution up to 0.5 mu m for a linear CCD with 14 mu m image sensing element size. Based on microcontroller, the integrated CCD sensor module and 2-D coordinate data acquisition module are developed to record the values of thickness and position coordinates. A distributed automatic data acquisition and control system is established by using the USB and RS485 serial bus to connect the host computer and measuring modules. In addition, to eliminate the factors that influence the on-line measurement accuracy, such as the roundness tolerance of roller, the irregularities of guide rail, an error compensation method based on multilayer feedforward neural network is used. The in situ experiments show that the on-line measurement standard deviation is 10 mu m within the measuring range of 10 mm.
会议录出版者	SPIE - The International Society for Optical Engineering ; USA
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/19144]
专题	清华大学
推荐引用方式 GB/T 7714	Guo Lifeng,Fan Yuming,Zhang Guoxiong,et al. CCD-based on-line thickness measurement system for calender[C]. 见:Proceedings of the SPIE - The International Society for Optical Engineering, Optical Design and Testing III, Beijing, China, INSPEC.

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