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	Effect of orientation noise on the determination of percolation thresholds from electron back-scatter pattern data
	Chen, HS ; Godfrey, A ; Liu, Q
	2010-05-10 ; 2010-05-10
会议名称	ICOTOM 14: TEXTURES OF MATERIALS, PTS 1AND 2 ; 14th International Conference on Textures of Materials ; Louvain, BELGIUM ; Web of Science ; INSPEC
关键词	EBSP/EBSD percolation high temperature superconductor YBCO FILMS GRAIN BOUNDARIES Materials Science, Multidisciplinary
中文摘要	The effect of orientation noise in EBSP data on measurement of percolation threshold values has been investigated by use of computer simulated microstructures. A 2-D Monte Carlo Potts model run on a square lattice of size 200 x 200 was used to generate a microstructure containing approximately 150 grains. Orientations were then assigned to each of these grains to generate single texture component microstructures of differing texture tightness ("model" data). In order to simulate the effect of orientation noise on the experimental data, the orientation at each point in the 200 x 200 grid was adjusted in a manner consistent with experimental observations of the effect of orientation noise. The model data represent therefore an underlying real grain structure, and the noise-adjusted data represent the orientation map that would be measured using EBSP analysis at a given orientation noise level. The misorientation angle theta(70%) at which 70% of the grains were percolatively connected was then determined for both the ideal data and for the orientation noise adjusted data. A comparison of the two allows calibration of the extent to which percolation data may be incorrectly estimated by EBSP measurements.
会议录出版者	TRANS TECH PUBLICATIONS LTD ; ZURICH-UETIKON ; BRANDRAIN 6, CH-8707 ZURICH-UETIKON, SWITZERLAND
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/18144]
专题	清华大学
推荐引用方式 GB/T 7714	Chen, HS,Godfrey, A,Liu, Q. Effect of orientation noise on the determination of percolation thresholds from electron back-scatter pattern data[C]. 见:ICOTOM 14: TEXTURES OF MATERIALS, PTS 1AND 2, 14th International Conference on Textures of Materials, Louvain, BELGIUM, Web of Science, INSPEC.

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