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	The role of lattice mismatch in the deposition of CdTe thin films
	Neretina, S. ; Zhang, Q. ; Hughes, R. A. ; Britten, J. F. ; Sochinskii, N. V. ; Preston, J. S. ; Mascher, P.
	2010-05-10 ; 2010-05-10
会议名称	JOURNAL OF ELECTRONIC MATERIALS ; US Workshop on the Physics and Chemistry of II-VI Materials ; Cambridge, MA ; Web of Science
关键词	cadmium telluride (CdTe) pulsed laser deposition (PLD) x-ray diffraction texture analysis MOLECULAR-BEAM EPITAXY PHOTOREFRACTIVE PROPERTIES GROWTH SUBSTRATE HGCDTE Engineering, Electrical & Electronic Materials Science, Multidisciplinary Physics, Applied
中文摘要	Cadmium telluride (CdTe) is the most well-established II-VI compound largely due to its use as a photonic material. Existing applications, as well as those under consideration, are demanding increasingly stringent control of the material properties. The deposition of high-quality thin films is of utmost importance to such applications. In this regard, we present a report detailing the role of lattice mismatch in determining the film quality. Thin films were deposited on a wide variety of substrate materials using the pulsed laser deposition (PLD) technique. Common to all substrates was the strong tendency toward the preferential alignment Of CdTe's (111) planes parallel to the substrate's surface. X-ray diffraction analysis, however, revealed that the crystalline quality varied dramatically depending upon the substrate used with the best results yielding a single-crystal film. This tendency. also manifested itself in the surface morphology with higher structural perfection yielding smoother surfaces. The film quality showed a strong correlation with lattice mismatch. Texture analysis using the [111] pole figure confirmed that improvements in the lattice mismatch led to a higher degree of in-plane alignment of the (111) grains.
会议录出版者	MINERALS METALS MATERIALS SOC ; WARRENDALE ; 184 THORN HILL RD, WARRENDALE, PA 15086 USA
语种	英语 ; 英语
内容类型	会议论文
源URL	[http://hdl.handle.net/123456789/18053]
专题	清华大学
推荐引用方式 GB/T 7714	Neretina, S.,Zhang, Q.,Hughes, R. A.,et al. The role of lattice mismatch in the deposition of CdTe thin films[C]. 见:JOURNAL OF ELECTRONIC MATERIALS, US Workshop on the Physics and Chemistry of II-VI Materials, Cambridge, MA, Web of Science.

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