The research works are summarized for Φ1.1m off-axis aspheric segments which are scaled-down TMT segments polished by NIAOT using SMAP (Stressed Mirror Annular Polishing) method in the previous phase and testing preparations for 1.44m mirrors.

The detailed introduction is given on result of errors analysis in contact detection testing of segments. In the second part, the selected basis of sampling number for contact-type detector arrays and the terms number of Zernike polynomials we need are studied.

And the situations on orthogonality destruction of Zernike polynomials in discrete points sampling case and spectral analysis for each order Spherical aberrations in continuous sampling are introduced.