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	Quantitative Evaluation of Security on Cryptographic ICs againstFault Injection Attacks
	C. Shao; H. Li; G. Xu
	2016
会议名称	ICISSP 2016
会议地点	Italy Rome
英文摘要	Fault injection attacks have become a serious threat against cryptographic ICs. However, the traditional security evaluation often demands experienced engineers repeatedly scan the IC under test for a few hours to a few days, and take the workload statistics and experiences as qualitative indexes as the evaluation results. This paper proposes a quantitative model to evaluate security based Design for Security Test (DFST), considering both the sensitive time during the algorithm operation and the sensitive area of the cryptographic IC against fault injection attacks. The case study on two RSA implementations demonstrates the feasibility of the quantitative evaluation of security model.
收录类别	EI
语种	英语
内容类型	会议论文
源URL	[http://ir.siat.ac.cn:8080/handle/172644/10076]
专题	深圳先进技术研究院_集成所
作者单位	2016
推荐引用方式 GB/T 7714	C. Shao,H. Li,G. Xu. Quantitative Evaluation of Security on Cryptographic ICs againstFault Injection Attacks[C]. 见:ICISSP 2016. Italy Rome.

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