Origin of a fourfold symmetric (0006) Bragg diffraction intensity in phi-scan mode on a 6H-SiC crystal

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	Origin of a fourfold symmetric (0006) Bragg diffraction intensity in phi-scan mode on a 6H-SiC crystal
	Gan, G ; Song, YT ; Sun, W ; Guo, LW ; Chen, XL
刊名	JOURNAL OF PHYSICS D-APPLIED PHYSICS
	2015
卷号	48 期号:43
公开日期	2016-12-26
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/60974]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Gan, G,Song, YT,Sun, W,et al. Origin of a fourfold symmetric (0006) Bragg diffraction intensity in phi-scan mode on a 6H-SiC crystal[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2015,48(43).
APA	Gan, G,Song, YT,Sun, W,Guo, LW,&Chen, XL.(2015).Origin of a fourfold symmetric (0006) Bragg diffraction intensity in phi-scan mode on a 6H-SiC crystal.JOURNAL OF PHYSICS D-APPLIED PHYSICS,48(43).
MLA	Gan, G,et al."Origin of a fourfold symmetric (0006) Bragg diffraction intensity in phi-scan mode on a 6H-SiC crystal".JOURNAL OF PHYSICS D-APPLIED PHYSICS 48.43(2015).