Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling

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	Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling
	Cui, AJ ; Liu, Z ; Dong, HL ; Wang, YJ ; Zhen, YG ; Li, WX ; Li, JJ ; Gu, CZ ; Hu, WP
刊名	ADVANCED MATERIALS
	2015
卷号	27 期号:19 页码:3002
公开日期	2016-12-26
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/60216]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Cui, AJ,Liu, Z,Dong, HL,et al. Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling[J]. ADVANCED MATERIALS,2015,27(19):3002.
APA	Cui, AJ.,Liu, Z.,Dong, HL.,Wang, YJ.,Zhen, YG.,...&Hu, WP.(2015).Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling.ADVANCED MATERIALS,27(19),3002.
MLA	Cui, AJ,et al."Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling".ADVANCED MATERIALS 27.19(2015):3002.