AFM image reconstruction research based on drift correlation model
Luan FJ(栾方军); Xie, Weiqi; Yuan S(袁帅); Xia, Xinghua; Kan, Fenglong
2015
会议名称IEEE International Conference on Robotics and Biomimetics (ROBIO)
会议日期December 06-09, 2015
会议地点Zhuhai, PEOPLES R CHINA
页码1906-1911
中文摘要The system drift causes the AFM tip to stochastically displacement in the sample surface of substrate when atomic force microscope imaging. This will give a notable effect on AFM image procedure, and results in distortion of scanning images. For this distortion, the paper establishes image compensation model, through associating the reference image and deformation image of the same sample region with 0 degrees and 90 degrees scanning angle respectively, to estimate horizontal and vertical displacement between the two images for reconstructing the reference image. The algorithm is verified by using simulation, and then is applied to AFM images. After image correction, nanoparticles aspect ratio is closer to 1, and relative distance changes between the nanoparticles from the system drift also meet the drift measurement results. These experimental results illustrate that the proposed method can effectively reduce the influence of system drift on AFM images and improve AFM image quality.
收录类别EI ; CPCI(ISTP)
产权排序2
会议主办者IEEE, IEEE ROBOT AUTOMA SOC, SHENZHEN ACAD ROBOT, GUANGDONG UNIV TECHNOL, MICHIGAN STATE UNIV, IT CHIBA AC, RSJ, SICE, JSME, IEEE/CAA J AUTOMATICA SINICA, UNIV HONG KONG
会议录2015 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND BIOMIMETICS (ROBIO)
会议录出版者IEEE
会议录出版地NEW YORK
语种英语
ISBN号978-1-4673-9675-2
WOS记录号WOS:000380476200318
内容类型会议论文
源URL[http://ir.sia.cn/handle/173321/19366]  
专题沈阳自动化研究所_机器人学研究室
推荐引用方式
GB/T 7714
Luan FJ,Xie, Weiqi,Yuan S,et al. AFM image reconstruction research based on drift correlation model[C]. 见:IEEE International Conference on Robotics and Biomimetics (ROBIO). Zhuhai, PEOPLES R CHINA. December 06-09, 2015.
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