False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments

CORC > 上海光学精密机械研究所 > 中国科学院上海光学精密机械研究所 > 高密度光存储技术实验室

	False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments
	Yan, Hui ; Wei, Jingsong
刊名	photonics res.
	2014
卷号	2 期号:2 页码:51
关键词	REFLECTION Z-SCAN OPTICAL NONLINEARITIES EXTERNAL-CAVITY BEAMS FEEDBACK REFRACTION
通讯作者	wei, js (reprint author), chinese acad sci, shanghai inst opt & fine mech, shanghai 201800, peoples r china.
英文摘要	with the development of semiconductor technology, semiconductor laser devices and semiconductor laser pump solid-state laser devices have been widely applied in z-scan experiments. however, the feedback light-induced output instability of semiconductor laser devices can negatively affect the accurate testing of the nonlinear index. in this work, the influence of feedback light on z-scan measurement is analyzed. then the calculated formula of feedback light-induced false nonlinear z-scan curves is theoretically derived and experimentally verified. two methods are proposed to reduce or eliminate the feedback light-induced false nonlinear effect. one is the addition of an attenuator to the z-scan optical path, and the other is the addition of an opto-isolator unit to the z-scan setup. the experimental and theoretical results indicate that the feedback light-induced false nonlinear effect is markedly reduced and can even be ignored if appropriate parameters are chosen. thus, theoretical and experimental methods of eliminating the negative effect of feedback light on z-scan measurement are useful for accurately obtaining the nonlinear index of a sample. (c) 2014 chinese laser press
收录类别	SCI
语种	英语
内容类型	期刊论文
版本	出版稿
源URL	[http://ir.siom.ac.cn/handle/181231/13285]
专题	上海光学精密机械研究所_高密度光存储技术实验室
作者单位	1.[Yan, Hui 2.Wei, Jingsong] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 3.[Yan, Hui] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Yan, Hui,Wei, Jingsong. False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments[J]. photonics res.,2014,2(2):51.
APA	Yan, Hui,&Wei, Jingsong.(2014).False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments.photonics res.,2(2),51.
MLA	Yan, Hui,et al."False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments".photonics res. 2.2(2014):51.