Design of twin computer-generated hologram for absolute testing of aspheric surfaces
Feng, Jie1,2; Deng, Chao1; Xing, Tingwen1
2014
会议名称Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
会议日期2014
卷号9282
页码92821M
通讯作者Feng, Jie
中文摘要Testing of aspheric surfaces by means of computer-generated holograms(CGHs)is well known. To perform an absolute test of rotationally symmetric aspheric surfaces, a specially designed computer-generated hologram (CGH) that reconstructs an aspherical wave as well as a spherical auxiliary wave. Since both phase functions have the same symmetry and their pattern is simultaneously encoded, we call this type of multiplex hologram a Twin-CGH. The spherical wave is used for calibration. The design principle of Twin-CGH is introduced in this paper. We mathematically analyze the Twin-CGH constructed by taking the phase corresponding to the linear combination of two weighted phase functions. We show that this Twin-CGH may be written as a new linear combination for the original phase functions with new weights. Then we absolutely test aspheric surfaces by Twin-CGH. © 2014 SPIE.
英文摘要Testing of aspheric surfaces by means of computer-generated holograms(CGHs)is well known. To perform an absolute test of rotationally symmetric aspheric surfaces, a specially designed computer-generated hologram (CGH) that reconstructs an aspherical wave as well as a spherical auxiliary wave. Since both phase functions have the same symmetry and their pattern is simultaneously encoded, we call this type of multiplex hologram a Twin-CGH. The spherical wave is used for calibration. The design principle of Twin-CGH is introduced in this paper. We mathematically analyze the Twin-CGH constructed by taking the phase corresponding to the linear combination of two weighted phase functions. We show that this Twin-CGH may be written as a new linear combination for the original phase functions with new weights. Then we absolutely test aspheric surfaces by Twin-CGH. © 2014 SPIE.
收录类别EI
学科主题Aspherics - Electron holography - Holograms - Lithography - Manufacture - Optical testing
语种英语
ISSN号0277786X
内容类型会议论文
源URL[http://ir.ioe.ac.cn/handle/181551/7491]  
专题光电技术研究所_应用光学研究室(二室)
作者单位1.Laboratory of Applied Optics, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China
2.University of Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Feng, Jie,Deng, Chao,Xing, Tingwen. Design of twin computer-generated hologram for absolute testing of aspheric surfaces[C]. 见:Proceedings of SPIE: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. 2014.
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