| DATA ACQUISITION AND FAULT DIAGNOSTIC SYSTEM OF SAMSUNG SUPERCONDUCTOR TEST FACILITY | |
| Y. Chu; H. Yonekawa; S. Baek; Y. K. Oh; S. Lee; W. Chung; K. Park; B. Lim; H. Park; K. Kim | |
| 2003 | |
| 会议名称 | Proceedings of the 9th International Conference on Accelerator & Large Experimental Physics Control Systems |
| 会议日期 | 2003 |
| 会议地点 | Korea |
| 内容类型 | 会议论文 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/248826]  |
| 专题 | 学术会议_国际参会_JaCoW高能所参会会议_ICALEPCS |
| 作者单位 | Korea Basic Science Institute, Daejeon, Korea |
| 推荐引用方式 GB/T 7714 | Y. Chu,H. Yonekawa,S. Baek,et al. DATA ACQUISITION AND FAULT DIAGNOSTIC SYSTEM OF SAMSUNG SUPERCONDUCTOR TEST FACILITY[C]. 见:Proceedings of the 9th International Conference on Accelerator & Large Experimental Physics Control Systems. Korea. 2003. |
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