| PROPOSED SCATTERED ELECTRON DETECTOR SYSTEM AS ONE OF THE BEAM OVERLAP DIAGNOSTIC TOOLS FOR THE NEW RHIC ELECTRON LENS | |
| P. Thieberger; E.N. Beebe; C. Chasman; W. Fischer; D.M. Gassner; X. Gu; R.C. Gupta; J. Hock; R.F. Lambiase; Y. Luo | |
| 2011 | |
| 会议名称 | Proceedings of 2011 Particle Accelerator Conference, New York, NY, USA |
| 会议日期 | 2011 |
| 会议地点 | New York |
| 页码 | 489--491 |
| 内容类型 | 会议论文 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/242917]  |
| 专题 | 学术会议_国际参会_JaCoW高能所参会会议_NA-PAC |
| 作者单位 | BNL, Upton, Long Island, New York, USA |
| 推荐引用方式 GB/T 7714 | P. Thieberger,E.N. Beebe,C. Chasman,et al. PROPOSED SCATTERED ELECTRON DETECTOR SYSTEM AS ONE OF THE BEAM OVERLAP DIAGNOSTIC TOOLS FOR THE NEW RHIC ELECTRON LENS[C]. 见:Proceedings of 2011 Particle Accelerator Conference, New York, NY, USA. New York. 2011. |
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