Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy

	Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy
	Wang, QZ; Yu RS(于润升); Qin XB(秦秀波); Wang BY(王宝义); Jia QJ(贾全杰); Yu, RS; Qin, XB; Li, YX; Wang, BY; Jia, QJ
刊名	ACTA PHYSICA SINICA
	2009
卷号	58 期号:12 页码:8478-8483
关键词	synchrotron radiation x-ray reflectivity Doppler broadening positronium time-of-flight
通讯作者	[Wang Qiao-Zhan ; Li Yu-Xiao] Zhengzhou Univ, Coll Phys Engn, Zhengzhou 450001, Peoples R China ; [Yu Run-Sheng ; Qin Xiu-Bo ; Wang Bao-Yi ; Jia Quan-jie] Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Anal Tech, Beijing 100049, Peoples R China
英文摘要	Mesoporous silica thin films with different pore shapes were prepared by evaporation induced self-assembly method. The synchrotron radiation x-ray reflectivity and slow positron annihilation techniques were used to characterize the pore structures. The results indicated that with increase of the spin-coating speed, the pore structure transformed from 3-D cubic to 2-D hexagonal, the average porosity also decreased. The correlation of the film structures and positron annihilation parameters was songht for with FT-IR spectroscopy and isotropic inorganic pore contraction model.
学科主题	Physics
类目[WOS]	Physics, Multidisciplinary
研究领域[WOS]	Physics
原文出处	SCI
语种	英语
WOS记录号	WOS:000273681500056
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/240139]
专题	高能物理研究所_多学科研究中心中国科学院高能物理研究所_中国散裂中子源
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Wang, QZ,Yu RS,Qin XB,et al. Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy[J]. ACTA PHYSICA SINICA,2009,58(12):8478-8483.
APA	Wang, QZ.,于润升.,秦秀波.,王宝义.,贾全杰.,...&Jia, QJ.(2009).Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy.ACTA PHYSICA SINICA,58(12),8478-8483.
MLA	Wang, QZ,et al."Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy".ACTA PHYSICA SINICA 58.12(2009):8478-8483.