The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films | |
Chen, XM; Wang, Y; Liu, CX; Zhao, YN; Mai, ZH; Gong, WZ; Zhao, BR; Jia, CJ; Zheng, WL; Zheng WL(郑文莉) | |
刊名 | INTERNATIONAL JOURNAL OF MODERN PHYSICS B |
2002 | |
卷号 | 16期号:23页码:3439-3447 |
关键词 | microstructure surface interface |
通讯作者 | Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China ; Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China |
英文摘要 | La0.5Ca0.5MnO3 (LCMO) thin films grown on SrTiO3 substrate with different thickness were investigated using high resolution X-ray diffraction, small angle reflectivity, and atomic force microscope (AFM). All the films are demonstrated to be c-axis oriented. The surface and interface structure of the films were obtained. It was found that the surface morphology of the films strongly depends on the thickness, and the film will crack when the thickness of the film reach a critical thickness. The surface roughness of the films increases with the thickness. The interface between the films and the substrates are very clear. There exists a non-designed cap layer on the surface of the LCMO layer. |
学科主题 | Physics |
类目[WOS] | Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical |
研究领域[WOS] | Physics |
原文出处 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000178300300004 |
内容类型 | 期刊论文 |
源URL | [http://ir.ihep.ac.cn/handle/311005/239916] |
专题 | 高能物理研究所_多学科研究中心 中国科学院高能物理研究所_人力资源处 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Chen, XM,Wang, Y,Liu, CX,et al. The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films[J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B,2002,16(23):3439-3447. |
APA | Chen, XM.,Wang, Y.,Liu, CX.,Zhao, YN.,Mai, ZH.,...&郑文莉.(2002).The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films.INTERNATIONAL JOURNAL OF MODERN PHYSICS B,16(23),3439-3447. |
MLA | Chen, XM,et al."The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films".INTERNATIONAL JOURNAL OF MODERN PHYSICS B 16.23(2002):3439-3447. |
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