Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS

	Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS
	Xie, Z; Kojima, I; Xie, YI; He, B; Chen, DL; Liu, T; Hu, TD; Zhang, XY; Wei, SQ; Xie YN(谢亚宁)
刊名	PHYSICA SCRIPTA
	2005
卷号	T115 页码:784-786
通讯作者	[Xie, Zhi ; He, Bo ; Chen, Dongliang ; Wei, Shiqiang] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Peoples R China ; [Kojima, Isao] Natl Inst Adv Ind Sci & Technol, AIST Tsukuba Cent 5, Higashi Ku, Tsukuba, Ibaraki 3058565, Japan ; [Xie, Yaning ; Liu, Tao ; Hu, Tiandou] Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China ; [Zhang, Xinyi] Fudan Univ, Synchrotron Radiat Res Ctr, Shanghai 200433, Peoples R China ; [Zhang, Xinyi] Fudan Univ, Natl Key Lab, Surface Phys Lab, Shanghai 200433, Peoples R China
英文摘要	The local structures of Pt thin films with thicknesses from 3 to 105 nm grown at 298 K have been studied by grazing incidence fluorescence XAFS technique. The results indicate that the bond length R = 2.77 angstrom and coordination number N = 12.0 of the first shell around Pt atoms in the Pt (105 nm) and Pt (30 nm) thin films are the same as those in Pt foil, except that the disorder degree sigma increases by about 8%. The magnitude peaks (located at 2.77, 3.92, 4.80 and 5.55 angstrom) appearing in the radial distribution function curves suggest that the Pt (105 nm) and Pt (30 nm) thin films keep a long-range order. With thickness decreasing from 105 to 10 nm, the Debye-Waller factor sigma(2) increases to 6.4 x 10(-3) angstrom(2) (sigma(2) = 4.8 x 10(-3) angstrom(2) for the Pt foil). For the Pt (3 nm) ultra-thin film, R-1, N-1 and sigma(2)(1) are 2.78 angstrom, 10.1 and 7.1 x 10(-3) angstrom(2), respectively. This implies that N-1 largely decreases and sigma(2)(1) strongly increases in the Pt (3 nm) ultra-thin film. Moreover, its magnitude peaks of the higher shells in the radial distribution function disappear for the Pt (3 nm) ultra-thin film. This result shows that the Pt lattice is largely distorted and the medium-range order around Pt atoms is completely destroyed for the Pt (3 nm) ultra-thin film. We consider that the Pt lattice distortion of the Pt ultra-thin film originates from both interaction between Pt particles and SiO2 substrate, and Pt grains with a smaller size forming a surface structure defect.
学科主题	Physics
类目[WOS]	Physics, Multidisciplinary
研究领域[WOS]	Physics
原文出处	SCI
语种	英语
WOS记录号	WOS:000204272100235
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/238482]
专题	高能物理研究所_多学科研究中心
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Xie, Z,Kojima, I,Xie, YI,et al. Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS[J]. PHYSICA SCRIPTA,2005,T115:784-786.
APA	Xie, Z.,Kojima, I.,Xie, YI.,He, B.,Chen, DL.,...&胡天斗.(2005).Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS.PHYSICA SCRIPTA,T115,784-786.
MLA	Xie, Z,et al."Local structures of ultra-thin Pt films probed by grazing incidence fluorescence XAFS".PHYSICA SCRIPTA T115(2005):784-786.