Development of bulk SiC single crystal grown by physical vapor transport method
Han, RJ; Xu, XG; Hu, XB; Yu, NS; Wang, JY; Tian, YL; Huang, WX; Tian YL(田玉莲); Huang WX(黄万霞)
刊名OPTICAL MATERIALS
2003
卷号23期号:1-2页码:415-420
关键词SiC crystal growth semiconductor defect
通讯作者Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China ; Inst High Energy Phys, Beijing Synchrotron Radiat Lab, Beijing 100039, Peoples R China
英文摘要This paper reviews the development of bulk SiC single crystals grown by physical vapor transport method, including the polytype control, defects and doped consideration. In addition, defects in commercial 6H-SiC wafer, such as micropipes, hexagonal voids and subgrain boundaries, are examined by transmission optical microscopy, X-ray synchrotron topography in back-reflection geometry and high-resolution X-ray diffraction methods. (C) 2003 Elsevier Science B.V. All rights reserved.
学科主题Materials Science; Optics
类目[WOS]Materials Science, Multidisciplinary ; Optics
研究领域[WOS]Materials Science ; Optics
原文出处SCI
语种英语
WOS记录号WOS:000183919200077
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/237383]  
专题高能物理研究所_多学科研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Han, RJ,Xu, XG,Hu, XB,et al. Development of bulk SiC single crystal grown by physical vapor transport method[J]. OPTICAL MATERIALS,2003,23(1-2):415-420.
APA Han, RJ.,Xu, XG.,Hu, XB.,Yu, NS.,Wang, JY.,...&黄万霞.(2003).Development of bulk SiC single crystal grown by physical vapor transport method.OPTICAL MATERIALS,23(1-2),415-420.
MLA Han, RJ,et al."Development of bulk SiC single crystal grown by physical vapor transport method".OPTICAL MATERIALS 23.1-2(2003):415-420.
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