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题名	双极运算放大器ELDRS效应及加速评估方法的研究
作者	许发月
学位类别	硕士
答辩日期	2011-06-01
授予单位	中国科学院研究生院
授予地点	北京
导师	陆妩
关键词	双极运算放大器 低剂量率辐射损伤增强效应 加速评估方法 60Coγ辐照
学位专业	微电子学与固体电子学
中文摘要	随着空间技术的不断发展，越来越多的电子元器件应用于空间系统。研究发现，这些电子元器件中有相当一部分双极器件在受到空间低剂量率的电离辐射后会产生低剂量率辐射损伤增强效应，使得实验室用大剂量率辐照评估此类器件抗辐射水平结果与器件实际抗辐射水平严重不符，从而给航天领域电子系统的可靠性带来极大隐患。所以通过对双极器件的辐射损伤机理的研究，找到一种能够在实验室推广的、高效可靠的双极器件加速评估方法具有非常重要意义。 本文的研究内容主要包括以下三个方面内容： 一方面，由于空间系统中双极运算放大器常以工作(正偏）和备用（零偏）两种状态存在，而国内外对双极运算放大器在不同剂量率条件下辐射效应的研究只局限在正偏状态。所以零偏时双极运算放大器的电离辐射损伤与正偏时有何不同，是否会对电路造成同样的损伤很值得研究，为此本文用不同型号的双极运算放大器，在正偏和零偏两种状态下分别用实际空间低剂量率和实验室高剂量率进行了辐照实验。结果发现：对具有低剂量率辐照损伤增强效应的PNP输入双极运算放大器来说，高剂量率辐照时正偏条件下的偏置电流变化稍大于零偏；低剂量率辐照时正偏下的偏置电流变化小于零偏，且在零偏置下的低剂量率辐照损伤增强效应更显著；对具有低剂量率辐照损伤增强效应的NPN输入双极运算放大器来说,不管在哪种剂量率下，零偏时的偏置电流变化总要比正偏时大。 另一方面，本实验室对双极器件的加速评估进行了大量的研究，并提出了变温辐照加速评估方法。其很好地评估了双极运算放大器的低剂量率辐照损伤，但只局限于正常工作(正偏）状态下，所以仍需对此方法在不同偏置状态下的适用性进行验证，从而使该方法进一步完善。本文用了不同型号的双极运算放大器在正偏和零偏两种状态下进行了变温辐照实验，结果显示：不管在哪种偏置状态下，对于有低剂量率损伤增强效应的器件，变温辐照的结果要明显高于室温高剂量率的辐照值，能很好的评估了低剂量率的辐照损伤；而对于没有剂量率效应的器件，变温辐照的结果也很好地鉴别了其辐射特性。 最后，由于美军标MIL-STD-883G给出的高剂量率辐照加温退火方法太过笼统，没有明确的辐照剂量率和退火温度说明。且国内外也没有关于高剂量率辐照加温退火来评估双极器件的ELRDS效应的报道。所以本文用LM833运算放大器进行了一系列的试探性实验，确定了适合的辐照剂量率和退火温度。然后选用了三种不同型号的PNP输入双极运算放大器，在正偏和零偏状态下进行了辐照实验，从而对高剂量率辐照后加温退火加速评估方法进行了探索。实验的结果表明:辐照后高温退火的实验结果乘以一定的倍数因子便可以较好地模拟PNP输入双极运算放大器的低剂量率辐照损伤，根据曲线的变化规律可以较快的鉴别器件是否存在低剂量率辐射损伤增强效应。
英文摘要	With the development of space techniques, more and more devices are used in the space system, but we have found that a lot of bipolar devices which have to suffer from the ionizing radiation have enhanced low dose rate sensitivity(ELDRS) effect, so there are seriously potential dangers for space electronic system because of the different evaluation results at different dose rates for devices, and therefore it is significative to find a wide-applied、effective and reliable accelerated evaluation methods for bipolar devices. This study includes the following three aspects： On one hand，bipolar operational amplifiers usually operate at forward bias and zero bias in space. And the study of radiation effect is confined to forward bias. Therefore, it is worth studying the difference of ionizing radiation damage at forward bias and zero bias. In this paper, Different types of bipolar operational amplifiers are radiated at low dose rate and high dose rate under forward bias and zero bias. Results show that: for PNP Input Bipolar Operational Amplifiers, the change of bias currents at forward bias is greater than that at zero bias for high dose rate. While for low dose rate irradiation, the change of bias currents at forward bias is less than that at zero bias. Two PNP input bipolar operational amplifiers exhibit enhanced low dose rate sensitivity (ELDRS) obviously and the ELDRS is more significant at zero bias. For NPN Input Bipolar Operational Amplifiers,Whatever the dose rate is, the change of bias currents at zero bias is greater than that at forward bias. On the other hand,our laboratory has done a lot of research about the accelerated simulation method by decreasing temperature in step during irradiation. It is a good assessment of Bipolar Operational Amplifiers’ enhanced low dose rate sensitivity. But the method is confined to forward bias，so we need to verify the applicability of this method at different biases and further improve the method. In the paper,different types of Bipolar operational amplifiers are radiated at low dose rate and high dose rate under forward bias and zero bias by decreasing temperature in step. The results showed that: Whatever the bias is, for enhanced low dose rate sensitivity(ELDRS) devices, The temperature irradiation results was significantly higher than room temperature high dose rate irradiation, and it can conservatively evaluate ELDRS at positive bias; and for no dose rate effect devices, the result of temperature irradiation is also good to identify the characteristics of radiation. Finally，as is given in MIL-STD-883G, the Accelerated Simulation Method by High temperature annealing after 60Coγ Irradiation is too ambiguous, it is no clear radiation dose rate and annealing temperature. Up to now, there are no reports about the accelerated simulation method. Therefore, we do a series of exploratory experiments about LM833 to determine the appropriate radiation dose rate and annealing temperature. Different types of PNP bipolar operational amplifiers are tested under forward bias and zero bias. Experiments show that: Multiply the result by multiple factors can better simulate the ELDRS. According to the variation curve, we can Identify whether it exists or not.
内容类型	学位论文
源URL	[http://ir.xjipc.cas.cn/handle/365002/4420]
专题	新疆理化技术研究所_材料物理与化学研究室
作者单位	中国科学院新疆理化技术研究所
推荐引用方式 GB/T 7714	许发月. 双极运算放大器ELDRS效应及加速评估方法的研究[D]. 北京. 中国科学院研究生院. 2011.

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