Choice of calibration equations of the TSM method

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	Choice of calibration equations of the TSM method
	Wang YL ; Chen ZY ; Zhu NH
	2002
会议名称	3rd international conference on microwave and millimeter wave technology
会议日期	aug 17-19, 2002
会议地点	beijing, peoples r china
关键词	calibration network analyzer frequency limitation scattering-parameter measurement NETWORK-ANALYZER CALIBRATION TEST FIXTURES
页码	150-153
通讯作者	wang yl cas inst semicond state key lab integrated optoelect pob 912 beijing 100083 peoples r china.
中文摘要	for the reciprocal-test fixtures, there are six independent s-parameters to. be determined, and the thru-short-match (tsm) calibration can provide eight calibration equations. in this paper, the relation of calibration equations is investigated. it has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations.
英文摘要	for the reciprocal-test fixtures, there are six independent s-parameters to. be determined, and the thru-short-match (tsm) calibration can provide eight calibration equations. in this paper, the relation of calibration equations is investigated. it has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantages of the established relation among the calibration equations and properly choosing calibration equations.; 于2010-10-29批量导入; made available in dspace on 2010-10-29t06:36:26z (gmt). no. of bitstreams: 1 2795.pdf: 209946 bytes, checksum: 5a1a788ffa195644b70076e11ed03e39 (md5) previous issue date: 2002; chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.; cas, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
收录类别	CPCI-S
会议主办者	chinese inst electr.; ieee microwave theory & techn soc.; ieee electron devices soc.; iee antennas & propagat soc.; electr soc, inst electr, informat & commun engineers japan.; korea inst telemat & electr.; ieee beijing sect.; iee beijing ctr.; ieee mtt s beijing chapter.
会议录	2002 3rd international conference on microwave and millimeter wave technology proceedings
会议录出版者	ieee ; 345 e 47th st, new york, ny 10017 usa
会议录出版地	345 e 47th st, new york, ny 10017 usa
学科主题	光电子学
语种	英语
ISBN号	0-7803-7486-x
内容类型	会议论文
源URL	[http://ir.semi.ac.cn/handle/172111/13611]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Wang YL,Chen ZY,Zhu NH. Choice of calibration equations of the TSM method[C]. 见:3rd international conference on microwave and millimeter wave technology. beijing, peoples r china. aug 17-19, 2002.