Structured dark-field imaging for single nano-particles

	Structured dark-field imaging for single nano-particles
	Chen, J; Gao, K; Wang, ZL; Yun, WB; Wu, ZY; Wu ZY(吴自玉)
刊名	CHINESE PHYSICS B
	2015
卷号	24 期号:8 页码:86804
关键词	x-ray microscopy Rayleigh resolution fast algorithm
英文摘要	In this work, we extensively describe and demonstrate the structured dark-field imaging (SDFI). SDFI is a newly proposed x-ray microscopy designed for revealing the fine features below Rayleigh resolution, in which different orders of scattered x-ray photons are collected by changing the numerical aperture of the condenser. Here, the samples of single particles are discussed to extend the scope of the SDFI technique reported in a previous work (Chen J, Gao K, Ge X, et al. 2013 Opt. Lett. 38 2068). In addition, the details of the newly invented algorithm are explained, which is able to calculate the intensity of any pixel on the image plane rapidly and reliably.
学科主题	Physics
类目[WOS]	Physics, Multidisciplinary
收录类别	SCI ; EI
WOS记录号	WOS:000361906000062
公开日期	2016-05-03
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/228792]
专题	高能物理研究所_多学科研究中心
推荐引用方式 GB/T 7714	Chen, J,Gao, K,Wang, ZL,et al. Structured dark-field imaging for single nano-particles[J]. CHINESE PHYSICS B,2015,24(8):86804.
APA	Chen, J,Gao, K,Wang, ZL,Yun, WB,Wu, ZY,&吴自玉.(2015).Structured dark-field imaging for single nano-particles.CHINESE PHYSICS B,24(8),86804.
MLA	Chen, J,et al."Structured dark-field imaging for single nano-particles".CHINESE PHYSICS B 24.8(2015):86804.