Fabrication of Silicon Crystal-Facet-Dependent Nanostructures by Electron-Beam Lithography
Zhang Yang; Yang Xiang; Han Weihua
刊名半导体学报
2008
卷号29期号:6页码:1057-1061
中文摘要silicon crystal-facet-dependent nanostructures have been successfully fabricated on a (100)-oriented silicon-on-insulator wafer using electron-beam lithography and the silicon anisotropic wet etching technique. this technique takes ad-vantage of the large difference in etching properties for different crystallographic planes in alkaline solution. the mini-mum size of the trapezoidal top for those si nanostructures can be reduced to less than 10nm. scanning electron microscopy(sem) and atomic force microscopy (afm) observations indicate that the etched nanostructures have controllable shapes and smooth surfaces.
学科主题微电子学
收录类别CSCD
资助信息国家自然科学基金(批准号:6 5 6 17,6 776 59),国家高技术研究发展计划(批准号:2 7aa 323 3)资助项目
语种英语
公开日期2010-11-23
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/16041]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Zhang Yang,Yang Xiang,Han Weihua. Fabrication of Silicon Crystal-Facet-Dependent Nanostructures by Electron-Beam Lithography[J]. 半导体学报,2008,29(6):1057-1061.
APA Zhang Yang,Yang Xiang,&Han Weihua.(2008).Fabrication of Silicon Crystal-Facet-Dependent Nanostructures by Electron-Beam Lithography.半导体学报,29(6),1057-1061.
MLA Zhang Yang,et al."Fabrication of Silicon Crystal-Facet-Dependent Nanostructures by Electron-Beam Lithography".半导体学报 29.6(2008):1057-1061.
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