High resolution X-ray diffraction investigation of epitaxially grown SrTiO_3 thin films by laser-MBE

	High resolution X-ray diffraction investigation of epitaxially grown SrTiO_3 thin films by laser-MBE
	Zhai ZY(翟章印); Wu XS(吴小山); Jia QJ(贾全杰)
刊名	中国物理C
	2009
期号	11 页码:949-953
关键词	laser-MBE grazing incident X-ray diffraction reciprocal space mapping
英文摘要	SrTiO3 thin films are epitaxially grown on DyScO3, LaAlO3 substrates with/without buffer layers of DyScO3 and SrRuO3 using laser-MBE.X-ray diffraction methods, such as high resolution X-ray diffraction, grazing incident X-ray diffraction, and reciprocal space mapping are used to investigate the latt...
公开日期	2016-02-25
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/222757]
专题	高能物理研究所_多学科研究中心
推荐引用方式 GB/T 7714	Zhai ZY,Wu XS,Jia QJ. High resolution X-ray diffraction investigation of epitaxially grown SrTiO_3 thin films by laser-MBE[J]. 中国物理C,2009(11):949-953.
APA	翟章印,吴小山,&贾全杰.(2009).High resolution X-ray diffraction investigation of epitaxially grown SrTiO_3 thin films by laser-MBE.中国物理C(11),949-953.
MLA	翟章印,et al."High resolution X-ray diffraction investigation of epitaxially grown SrTiO_3 thin films by laser-MBE".中国物理C .11(2009):949-953.